Yoshikawa K~Shimizu H, 2011

Pubmed ID 21341307
Title Comprehensive phenotypic analysis of single-gene deletion and overexpression strains of Saccharomyces cerevisiae.
Authors Katsunori Yoshikawa, Tadamasa Tanaka, Yoshihiro Ida, Chikara Furusawa, Takashi Hirasawa, Hiroshi Shimizu
Abstract We quantified the growth behaviour of all available single-gene deletion and overexpression strains of budding yeast. Genome-wide analyses enabled the extraction of the genes and identification of the functional categories for which genetic perturbation caused the change of growth behaviour. Statistical analyses revealed defective growth for 646 deletion and 1302 overexpression strains. We classified these deleted and overexpressed genes into known functional categories, and identified several functional categories having fragility and robustness for cellular growth. We also screened the deletion and overexpression strains that exhibited a significantly higher growth rate than the strain without genetic perturbation, and found that three deletion and two overexpression strains were high-growth strains. The genes and functional categories identified in the analysis might provide useful information on designing industrially useful yeast strains.
Citation Yeast 2011; 28:349-61


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Paper Phenotype Condition Medium Collection Tested mutants Data Details
Yoshikawa K~Shimizu H, 2011 growth (exponential growth rate) standard SC Gal [0.2%], Raf [4%] hap alpha 4,703 Quantitative

Curation history

Tested strains

March 8, 2013 Loaded.


March 8, 2013 Loaded.